GaN 晶圓片/AlN晶圓片


氮化鎵(GaN)晶片的材料生長是相當先進的技術,可以應用在新一代的顯示技術上,舉凡節能照明,微波通訊,電子電力,醫學成像等領域都可以廣泛使用。

目前我們主要提供的產品有:

一、15~40微米厚度的2英吋厚膜氮化鎵晶圓片(GaN/sapphire),位錯密度為107/cm2量級,分為n型摻雜、非摻雜和半絕緣三種類型

二、2英吋自支撐氮化鎵晶圓片 ( Free-Standing GaN Substrate),厚度0.25~0.35mm,位錯密度為105/cm2量級,分為N型摻雜、非摻雜和半絕緣三種類型

三、小尺寸方形(邊長5mm~20mm)自支撐氮化鎵晶圓片,位錯密度為105/cm2量級,分為N型摻雜、非摻雜和半絕緣三種類型,單面或者雙面拋光

四、小尺寸非極性面和半極性面自支撐氮化鎵晶圓片,a面或者m面

五、4英寸氮化鎵厚膜晶片  

六、氮化鋁晶圓片

一、2英吋厚膜氮化鎵晶圓片

產品型號 GaN-T-C-U-C50 GaN-T-C-N-C50 GaN-T-C-P-C50
尺寸 Ф50.8 ± 0.1 mm Ф50.8 ± 0.1 mm Ф50.8 ± 0.1 mm
厚度 4.5±0.5 µm, 20±2 µm 4.5±0.5 µm, 20±2 µm 4.5±0.5 µm
晶體取向 C-plane(0001) ± 0.5° C-plane(0001) ± 0.5° C-plane(0001) ± 0.5°
導電類型 N-type(Undoped) N-type(Si-doped) P-type(Mg-doped)
電阻率(300 K) < 0.5Ω·cm < 0.05Ω·cm ~10Ω·cm
載流子濃度 < 5x1017cm-3 >  1x1018cm-3 >  6x1016cm-3
遷移率 ~ 300cm2/V•s ~ 200cm2/V•s ~ 10cm2/V•s
位元錯密度 Less than 5x108 cm-2(estimated by FWHMs of XRD) Less than 5x108 cm-2(estimated by FWHMs of XRD) Less than 5x108cm-2(estimated by FWHMs of XRD)
襯底結構 GaN on sapphire (standard :SSP option:DSP) GaN on sapphire (standard :SSP option:DSP) GaN on sapphire (standard :SSP option:DSP)
有效面積 >90% >90% >90%
包裝 Packaged in a class 100 clean room environment, in cassette of 25pcs  Packaged in a class 100 clean room environment, in cassette of 25pcs  Packaged in a class 100 clean room environment, in cassette of 25pcs 
or single container , under a nitrogen atmosphere. or single container , under a nitrogen atmosphere. or single container , under a nitrogen atmosphere.

 

 二、2英吋自支撐氮化鎵晶圓片

2 inch

產品型號 GaN-FS-C-U-C50 GaN-FS-C-N-C50 GaN-FS-C-SI-C50
尺寸 Ф 50.8  ± 1 mm Ф 50.8  ± 1 mm Ф 50.8  ± 1 mm
厚度 350 ± 25 µm 350 ± 25 µm 350 ± 25 µm
有效面積 >90% >90% >90%
晶體取向 C-plane (0001) off angle toward M-Axis 0.35°± 0.15° C-plane (0001) off angle toward M-Axis 0.35°± 0.15° C-plane (0001) off angle toward M-Axis 0.35°± 0.15°
主定位邊 (1-100)±0.5°,16.0±1.0mm (1-100)±0.5°,16.0±1.0mm (1-100)±0.5°,16.0±1.0mm
次定位邊 (11-20)±3°,8.0±1.0mm (11-20)±3°,8.0±1.0mm (11-20)±3°,8.0±1.0mm
TTV 15µm 15µm 15µm
彎曲度 20µm 20µm 20µm
導電類型 N-type N-type Semi-Insulating
電阻率
(300 K)
< 0.1Ω·cm < 0.05Ω·cm > 106 Ω·cm
位元錯密度 From 1x105 to 3x106 cm-2 From1x105 to3x106 cm-2 From1x105 to 3x106 cm-2
拋光 Front surface:Ra<0.2 nm(polished); Front surface:Ra<0.2 nm(polished); Front surface:Ra<0.2 nm(polished);
or<0.3nm (polished and surface treatment for epitaxy) or<0.3nm (polished and surface treatment for epitaxy) or<0.3nm (polished and surface treatment for epitaxy)
Back Surface:0.5~1.5μm; Back Surface:0.5~1.5μm; Back Surface:0.5~1.5μm;
option:1-3nm (Fine ground); < 0.2nm(polished) option:1-3nm (Fine ground); < 0.2nm(polished) option:1-3nm (Fine ground); < 0.2nm(polished)
包裝 Packaged in a class 100 clean room environment, Packaged in a class 100 clean room environment, Packaged in a class 100 clean room environment,
 in single container,under a nitrogen atmosphere.  in single container,under a nitrogen atmosphere.  in single container,under a nitrogen atmosphere.

 


 
三、小尺寸方形(邊長5~20mm)自支撐氮化鎵晶圓片



產品型號 GaN-FS-C-U-S10 GaN-FS-C-N-S10 GaN-FS-C-SI-S10
尺寸 10×10.5mm2 10×10.5mm2 10×10.5mm2
厚度 350±25μm 350±25μm 350±25μm
晶體取向 C-plane(0001)off angle toward M-Axis 0.35°±0.15° C-plane(0001)off angle toward M-Axis 0.35°±0.15° C-plane(0001)off angle toward M-Axis 0.35°±0.15°
TTV 10µm 10µm 10µm
彎曲度 10µm 10µm 10µm
導電類型 N-type N-type Semi-Insulating
電阻率(300 K) < 0.1Ω·cm < 0.05Ω·cm > 106Ω·cm
位元錯密度 From 1x105 to 3x106cm-2 From 1x105 to 3x106cm-2 From 1x105to 3x106cm-2
有效面積 >90% >90% >90%
拋光 Front Surface:Ra<0.2 nm(polished); Front Surface:Ra<0.2 nm(polished); Front Surface:Ra<0.2 nm(polished);
or <0.3nm(polished and surface treatment for epitaxy) or <0.3nm(polished and surface treatment for epitaxy) or <0.3nm(polished and surface treatment for epitaxy)
Back Surface:0.5~1.5μm; Back Surface:0.5~1.5μm; Back Surface:0.5~1.5μm;
option:1-3nm(Fine ground);<0.2nm(polished) option:1-3nm(Fine ground);<0.2nm(polished) option:1-3nm(Fine ground);<0.2nm(polished)
包裝 Packaged in a class 100 clean room environment, Packaged in a class 100 clean room environment, Packaged in a class 100 clean room environment, 
 in single container,under a nitrogen atmosphere.  in single container,under a nitrogen atmosphere. iin single container,under a nitrogen atmosphere.

 

 

四、小尺寸非極性面和半極性面自支撐氮化鎵晶圓片
 



產品型號 GaN-FS-A-U/N/SI-S GaN-FS-M-U/N/SI-S GaN-FS-SP-U/N/SI-S
尺寸 (5.0~10.0)× 10.0 mm2 (5.0~10.0)× 10.0 mm2 (5.0~10.0)× 10.0 mm2
(5.0~10.0)× 20.0mm2 (5.0~10.0)× 20.0mm2 (5.0~10.0)× 20.0mm2
厚度 350±25μm 350±25μm 350±25μm
晶面 (11-20) (1-100) (20-21)
(20-2-1)
(11-22)
(10-11)
斜切角 -1°±0.2° -1°±0.2° -1°±0.2°
TTV 10µm 10µm 10µm
彎曲度 10µm 10µm 10µm
導電類型 N-type  < 0.1Ω·cm N-type  < 0.1Ω·cm N-type  < 0.1Ω·cm
電阻率(300 K) N-type < 0.05Ω·cm N-type < 0.05Ω·cm N-type < 0.05Ω·cm
  Semi-Insulating > 106Ω·cm Semi-Insulating > 106Ω·cm Semi-Insulating > 106Ω·cm
位元錯密度 From 1x105 to 3x106cm-2 From 1x105 to 3x106 cm-2 From 1x105 to 3x106 cm-2
有效面積 >90% >90% >90%
拋光 Front Surface:Ra<0.2 nm(polished); Front Surface:Ra<0.2 nm(polished) Front Surface:Ra<0.2 nm(polished)
Back Surface:1-3nm(fine ground); Back Surface:1-3nm(fine ground); Back Surface:1-3nm(fine ground);
option:<0.2nm(polished) option:<0.2nm(polished). option:<0.2nm(polished).
包裝 Packaged in a class 100 clean room environment, Packaged in a class 100 clean room environment,  Packaged in a class 100 clean room environment, 
 in single container,under a nitrogen atmosphere. in single container,under a nitrogen atmosphere. in single container,under a nitrogen atmosphere.
五、4英寸氮化鎵厚膜晶片

產品型號 GaN-T-C-U-C100 GaN-T-C-N-C100
尺寸 Ф 100 ± 0.1 mm Ф 100 ± 0.1 mm
厚度 4.5±0.5 µm, 20±2 µm 4.5±0.5 µm, 20±2 µm
晶體取向 C-plane(0001) ± 0.5° C-plane(0001) ± 0.5°
導電類型 N-type(Undoped) N-type(Si-doped)
電阻率(300 K) < 0.5Ω·cm < 0.05Ω·cm
載流子濃度 < 5x1017cm-3 >  1x1018cm-3
遷移率 ~ 300cm2/V•s ~ 200cm2/V•s
位元錯密度 Less than 5x108 cm-2(estimated by FWHMs of XRD) Less than 5x108 cm-2(estimated by FWHMs of XRD)
襯底結構 GaN on sapphire (standard :SSP option:DSP) GaN on sapphire (standard :SSP option:DSP)
有效面積 >90% >90%
包裝 Packaged in a class 100 clean room environment, in cassette of 25pcs  Packaged in a class 100 clean room environment, in cassette of 25pcs 
or single container , under a nitrogen atmosphere. or single container , under a nitrogen atmosphere.
、2英寸氮化鋁厚膜晶片

產品型號 AlN-T-C-C50
尺寸 Ф 50.8 ± 0.1 mm
厚度 4±1.5µm
晶體取向 C-plane (0001)
導電類型 Semi-Insulating
晶體品質 XRD FWHM of (0002) < 350 arcsec  
XRD FWHM of (1012) < 450 arcsec
表面粗糙度 Ra < 5 nm (10 x 10 µm2)
襯底結構 AlN on sapphire (SSP)
有效面積 Exclusion zone< 2 mm
包裝 Packaged in a class 100 clean room environment, in cassette of 25pcs 
or single container , under a nitrogen atmosphere.