氮化鎵(GaN)晶片的材料生長是相當先進的技術,可以應用在新一代的顯示技術上,舉凡節能照明,微波通訊,電子電力,醫學成像等領域都可以廣泛使用。
目前我們主要提供的產品有:
一、15~40微米厚度的2英吋厚膜氮化鎵晶圓片(GaN/sapphire),位錯密度為107/cm2量級,分為n型摻雜、非摻雜和半絕緣三種類型
二、2英吋自支撐氮化鎵晶圓片 ( Free-Standing GaN Substrate),厚度0.25~0.35mm,位錯密度為105/cm2量級,分為N型摻雜、非摻雜和半絕緣三種類型
三、小尺寸方形(邊長5mm~20mm)自支撐氮化鎵晶圓片,位錯密度為105/cm2量級,分為N型摻雜、非摻雜和半絕緣三種類型,單面或者雙面拋光
四、小尺寸非極性面和半極性面自支撐氮化鎵晶圓片,a面或者m面
五、4英寸氮化鎵厚膜晶片
六、氮化鋁晶圓片
一、2英吋厚膜氮化鎵晶圓片
產品型號 | GaN-T-C-U-C50 | GaN-T-C-N-C50 | GaN-T-C-P-C50 |
尺寸 | Ф50.8 ± 0.1 mm | Ф50.8 ± 0.1 mm | Ф50.8 ± 0.1 mm |
厚度 | 4.5±0.5 µm, 20±2 µm | 4.5±0.5 µm, 20±2 µm | 4.5±0.5 µm |
晶體取向 | C-plane(0001) ± 0.5° | C-plane(0001) ± 0.5° | C-plane(0001) ± 0.5° |
導電類型 | N-type(Undoped) | N-type(Si-doped) | P-type(Mg-doped) |
電阻率(300 K) | < 0.5Ω·cm | < 0.05Ω·cm | ~10Ω·cm |
載流子濃度 | < 5x1017cm-3 | > 1x1018cm-3 | > 6x1016cm-3 |
遷移率 | ~ 300cm2/V•s | ~ 200cm2/V•s | ~ 10cm2/V•s |
位元錯密度 | Less than 5x108 cm-2(estimated by FWHMs of XRD) | Less than 5x108 cm-2(estimated by FWHMs of XRD) | Less than 5x108cm-2(estimated by FWHMs of XRD) |
襯底結構 | GaN on sapphire (standard :SSP option:DSP) | GaN on sapphire (standard :SSP option:DSP) | GaN on sapphire (standard :SSP option:DSP) |
有效面積 | >90% | >90% | >90% |
包裝 | Packaged in a class 100 clean room environment, in cassette of 25pcs | Packaged in a class 100 clean room environment, in cassette of 25pcs | Packaged in a class 100 clean room environment, in cassette of 25pcs |
or single container , under a nitrogen atmosphere. | or single container , under a nitrogen atmosphere. | or single container , under a nitrogen atmosphere. |
二、2英吋自支撐氮化鎵晶圓片
產品型號 | GaN-FS-C-U-C50 | GaN-FS-C-N-C50 | GaN-FS-C-SI-C50 |
尺寸 | Ф 50.8 ± 1 mm | Ф 50.8 ± 1 mm | Ф 50.8 ± 1 mm |
厚度 | 350 ± 25 µm | 350 ± 25 µm | 350 ± 25 µm |
有效面積 | >90% | >90% | >90% |
晶體取向 | C-plane (0001) off angle toward M-Axis 0.35°± 0.15° | C-plane (0001) off angle toward M-Axis 0.35°± 0.15° | C-plane (0001) off angle toward M-Axis 0.35°± 0.15° |
主定位邊 | (1-100)±0.5°,16.0±1.0mm | (1-100)±0.5°,16.0±1.0mm | (1-100)±0.5°,16.0±1.0mm |
次定位邊 | (11-20)±3°,8.0±1.0mm | (11-20)±3°,8.0±1.0mm | (11-20)±3°,8.0±1.0mm |
TTV | ≤15µm | ≤15µm | ≤15µm |
彎曲度 | ≤20µm | ≤20µm | ≤20µm |
導電類型 | N-type | N-type | Semi-Insulating |
電阻率 (300 K) |
< 0.1Ω·cm | < 0.05Ω·cm | > 106 Ω·cm |
位元錯密度 | From 1x105 to 3x106 cm-2 | From1x105 to3x106 cm-2 | From1x105 to 3x106 cm-2 |
拋光 | Front surface:Ra<0.2 nm(polished); | Front surface:Ra<0.2 nm(polished); | Front surface:Ra<0.2 nm(polished); |
or<0.3nm (polished and surface treatment for epitaxy) | or<0.3nm (polished and surface treatment for epitaxy) | or<0.3nm (polished and surface treatment for epitaxy) | |
Back Surface:0.5~1.5μm; | Back Surface:0.5~1.5μm; | Back Surface:0.5~1.5μm; | |
option:1-3nm (Fine ground); < 0.2nm(polished) | option:1-3nm (Fine ground); < 0.2nm(polished) | option:1-3nm (Fine ground); < 0.2nm(polished) | |
包裝 | Packaged in a class 100 clean room environment, | Packaged in a class 100 clean room environment, | Packaged in a class 100 clean room environment, |
in single container,under a nitrogen atmosphere. | in single container,under a nitrogen atmosphere. | in single container,under a nitrogen atmosphere. |
三、小尺寸方形(邊長5~20mm)自支撐氮化鎵晶圓片
產品型號 | GaN-FS-C-U-S10 | GaN-FS-C-N-S10 | GaN-FS-C-SI-S10 |
尺寸 | 10×10.5mm2 | 10×10.5mm2 | 10×10.5mm2 |
厚度 | 350±25μm | 350±25μm | 350±25μm |
晶體取向 | C-plane(0001)off angle toward M-Axis 0.35°±0.15° | C-plane(0001)off angle toward M-Axis 0.35°±0.15° | C-plane(0001)off angle toward M-Axis 0.35°±0.15° |
TTV | ≤10µm | ≤10µm | ≤10µm |
彎曲度 | ≤10µm | ≤10µm | ≤10µm |
導電類型 | N-type | N-type | Semi-Insulating |
電阻率(300 K) | < 0.1Ω·cm | < 0.05Ω·cm | > 106Ω·cm |
位元錯密度 | From 1x105 to 3x106cm-2 | From 1x105 to 3x106cm-2 | From 1x105to 3x106cm-2 |
有效面積 | >90% | >90% | >90% |
拋光 | Front Surface:Ra<0.2 nm(polished); | Front Surface:Ra<0.2 nm(polished); | Front Surface:Ra<0.2 nm(polished); |
or <0.3nm(polished and surface treatment for epitaxy) | or <0.3nm(polished and surface treatment for epitaxy) | or <0.3nm(polished and surface treatment for epitaxy) | |
Back Surface:0.5~1.5μm; | Back Surface:0.5~1.5μm; | Back Surface:0.5~1.5μm; | |
option:1-3nm(Fine ground);<0.2nm(polished) | option:1-3nm(Fine ground);<0.2nm(polished) | option:1-3nm(Fine ground);<0.2nm(polished) | |
包裝 | Packaged in a class 100 clean room environment, | Packaged in a class 100 clean room environment, | Packaged in a class 100 clean room environment, |
in single container,under a nitrogen atmosphere. | in single container,under a nitrogen atmosphere. | iin single container,under a nitrogen atmosphere. |
四、小尺寸非極性面和半極性面自支撐氮化鎵晶圓片
產品型號 | GaN-FS-A-U/N/SI-S | GaN-FS-M-U/N/SI-S | GaN-FS-SP-U/N/SI-S |
尺寸 | (5.0~10.0)× 10.0 mm2 | (5.0~10.0)× 10.0 mm2 | (5.0~10.0)× 10.0 mm2 |
(5.0~10.0)× 20.0mm2 | (5.0~10.0)× 20.0mm2 | (5.0~10.0)× 20.0mm2 | |
厚度 | 350±25μm | 350±25μm | 350±25μm |
晶面 | (11-20) | (1-100) | (20-21) (20-2-1) (11-22) (10-11) |
斜切角 | -1°±0.2° | -1°±0.2° | -1°±0.2° |
TTV | ≤10µm | ≤10µm | ≤10µm |
彎曲度 | ≤10µm | ≤10µm | ≤10µm |
導電類型 | N-type < 0.1Ω·cm | N-type < 0.1Ω·cm | N-type < 0.1Ω·cm |
電阻率(300 K) | N-type < 0.05Ω·cm | N-type < 0.05Ω·cm | N-type < 0.05Ω·cm |
Semi-Insulating > 106Ω·cm | Semi-Insulating > 106Ω·cm | Semi-Insulating > 106Ω·cm | |
位元錯密度 | From 1x105 to 3x106cm-2 | From 1x105 to 3x106 cm-2 | From 1x105 to 3x106 cm-2 |
有效面積 | >90% | >90% | >90% |
拋光 | Front Surface:Ra<0.2 nm(polished); | Front Surface:Ra<0.2 nm(polished) | Front Surface:Ra<0.2 nm(polished) |
Back Surface:1-3nm(fine ground); | Back Surface:1-3nm(fine ground); | Back Surface:1-3nm(fine ground); | |
option:<0.2nm(polished) | option:<0.2nm(polished). | option:<0.2nm(polished). | |
包裝 | Packaged in a class 100 clean room environment, | Packaged in a class 100 clean room environment, | Packaged in a class 100 clean room environment, |
in single container,under a nitrogen atmosphere. | in single container,under a nitrogen atmosphere. | in single container,under a nitrogen atmosphere. |
五、4英寸氮化鎵厚膜晶片
產品型號 | GaN-T-C-U-C100 | GaN-T-C-N-C100 |
尺寸 | Ф 100 ± 0.1 mm | Ф 100 ± 0.1 mm |
厚度 | 4.5±0.5 µm, 20±2 µm | 4.5±0.5 µm, 20±2 µm |
晶體取向 | C-plane(0001) ± 0.5° | C-plane(0001) ± 0.5° |
導電類型 | N-type(Undoped) | N-type(Si-doped) |
電阻率(300 K) | < 0.5Ω·cm | < 0.05Ω·cm |
載流子濃度 | < 5x1017cm-3 | > 1x1018cm-3 |
遷移率 | ~ 300cm2/V•s | ~ 200cm2/V•s |
位元錯密度 | Less than 5x108 cm-2(estimated by FWHMs of XRD) | Less than 5x108 cm-2(estimated by FWHMs of XRD) |
襯底結構 | GaN on sapphire (standard :SSP option:DSP) | GaN on sapphire (standard :SSP option:DSP) |
有效面積 | >90% | >90% |
包裝 | Packaged in a class 100 clean room environment, in cassette of 25pcs | Packaged in a class 100 clean room environment, in cassette of 25pcs |
or single container , under a nitrogen atmosphere. | or single container , under a nitrogen atmosphere. |
六、2英寸氮化鋁厚膜晶片
產品型號 | AlN-T-C-C50 |
尺寸 | Ф 50.8 ± 0.1 mm |
厚度 | 4±1.5µm |
晶體取向 | C-plane (0001) |
導電類型 | Semi-Insulating |
晶體品質 | XRD FWHM of (0002) < 350 arcsec |
XRD FWHM of (1012) < 450 arcsec | |
表面粗糙度 | Ra < 5 nm (10 x 10 µm2) |
襯底結構 | AlN on sapphire (SSP) |
有效面積 | Exclusion zone< 2 mm |
包裝 | Packaged in a class 100 clean room environment, in cassette of 25pcs |
or single container , under a nitrogen atmosphere. |